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T1 and T2 Dual-mode MRI Contrast Agent for Enhancing Accuracy by Engineered Nanomaterials

Authors
 Tae-Hyun Shin  ;  Jin-sil Choi  ;  Seokhwan Yun  ;  Il-Sun Kim  ;  Ho-Taek Song  ;  Youngmee Kim  ;  Kook In Park  ;  Jinwoo Cheon 
Citation
 ACS NANO, Vol.8(4) : 3393-3401, 2014 
Journal Title
 ACS NANO 
ISSN
 1936-0851 
Issue Date
2014
MeSH
Animals ; Artifacts* ; Brain/cytology ; Cell Tracking ; Contrast Media*/chemistry ; Embryonic Stem Cells/cytology ; Engineering* ; Female ; Humans ; Magnetic Resonance Imaging/methods* ; Magnets/chemistry ; Manganese/chemistry ; Models, Molecular ; Molecular Conformation ; Nanoparticles*/chemistry ; Organometallic Compounds/chemistry ; Pregnancy ; Rats
Abstract
One of the holy grails in biomedical imaging technology is to achieve accurate imaging of biological targets. The development of sophisticated instrumentation and the use of contrast agents have improved the accuracy of biomedical imaging. However, the issue of false imaging remains a problem. Here, we developed a dual-mode artifact filtering nanoparticle imaging agent (AFIA) that comprises a combination of paramagnetic and superparamagnetic nanomaterials. This AFIA has the ability to perform “AND logic gate” algorithm to eliminate false errors (artifacts) from the raw images to enhance accuracy of the MRI. We confirm the artifact filtering capability of AFIA in MRI phantoms and further demonstrate that artifact-free imaging of stem cell migration is possible in vivo.
Full Text
http://pubs.acs.org/doi/abs/10.1021/nn405977t
DOI
10.1021/nn405977t
Appears in Collections:
1. College of Medicine (의과대학) > Yonsei Biomedical Research Center (연세의생명연구원) > 1. Journal Papers
1. College of Medicine (의과대학) > Dept. of Pediatrics (소아청소년과학교실) > 1. Journal Papers
1. College of Medicine (의과대학) > Dept. of Radiology (영상의학교실) > 1. Journal Papers
Yonsei Authors
Kim, Il-Sun(김일선) ORCID logo https://orcid.org/0000-0003-4033-4323
Park, Kook In(박국인) ORCID logo https://orcid.org/0000-0001-8499-9293
Song, Ho Taek(송호택) ORCID logo https://orcid.org/0000-0002-6655-2575
Yun, Seok Hwan(윤석환)
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/98816
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