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Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging

Authors
 Kyujung Kim  ;  Eun-Jin Cho  ;  and Donghyun Kim  ;  Yong-Min Huh 
Citation
 Optics Letters, Vol.32(21) : 3062-3064, 2007 
Journal Title
 Optics Letters 
ISSN
 0146-9592 
Issue Date
2007
Abstract
We investigated experimentally the evanescent field enhancement based on dielectric thin films in total internal reflection microscopy. The sample employed two layers of Al2O3 and SiO2 deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent excitation of microbeads relative to that of a control sample without dielectric films was polarization dependent, determined as 4.2 and 2.4 for TE and TM polarizations, respectively, and was in good agreement with numerical results. The thin-film-based field enhancement was also applied to live-cell imaging of quantum dots, which confirmed the sensitivity enhancement qualitatively.
Full Text
http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-32-21-3062
DOI
10.1364/OL.32.003062
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Radiology (영상의학교실) > 1. Journal Papers
Yonsei Authors
Huh, Yong Min(허용민) ORCID logo https://orcid.org/0000-0002-9831-4475
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URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/97243
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