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Transient induction of neuronal nitric oxide synthase in neurons of rat cerebral cortex after status epilepticus

Authors
 Youngbuhm Huh  ;  Kyoung Heo  ;  Chan Park  ;  Heekyung Ahn 
Citation
 Neuroscience Letters, Vol.281(1) : 49-52, 2000 
Journal Title
NEUROSCIENCE LETTERS
ISSN
 0304-3940 
Issue Date
2000
MeSH
Animals ; Cell Count ; Cerebral Cortex/cytology ; Cerebral Cortex/enzymology* ; Gene Expression Regulation, Enzymologic ; Male ; Neurons/enzymology* ; Nitric Oxide Synthase/genetics* ; Nitric Oxide Synthase Type I ; RNA, Messenger/genetics ; RNA, Messenger/metabolism ; Rats ; Rats, Inbred F344 ; Reverse Transcriptase Polymerase Chain Reaction ; Status Epilepticus/physiopathology*
Keywords
Induction ; Neuronal nitric oxide synthase ; Cerebral cortex ; Kainate ; Status epilepticus
Abstract
The change in neuronal nitric oxide synthase (nNOS) expression after status epilepticus induced by kainate was examined in the rat cerebral cortex. Expressional change was assessed using nNOS immunohistochemistry and reverse transcription-polymerase chain reaction for nNOS mRNA. Constitutive nNOS-positive neurons was observed in the cerebral cortex of the control group. At 1 and 3 days after status epilepticus, nNOS-positive neurons were present in a deep layer of various cortical regions such as primary motor cortex, secondary motor cortex, primary somatosensory cortex, secondary somatosensory cortex, parietal association cortex, insular cortex, ectorhinal cortex, temporal association cortex, auditory cortex and visual cortex. The level of nNOS mRNA increased at 1, 3, 6 and 12 days after status epilepticus compared to controls. This report provides the first morphological evidence that nNOS are induced in neurons of the cerebral cortex following seizure.
Full Text
https://www.sciencedirect.com/science/article/pii/S0304394000008004
DOI
10.1016/S0304-3940(00)00800-4
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Neurology (신경과학교실) > 1. Journal Papers
Yonsei Authors
Heo, Kyoung(허경)
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/171820
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