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Sequential Change of Wound Calculated by Image Analysis Using a Color Patch Method during a Secondary Intention Healing

Authors
 Sejung Yang  ;  Junhee Park  ;  Hanuel Lee  ;  Soohyun Kim  ;  Byung-Uk Lee  ;  Kee-Yang Chung  ;  Byungho Oh 
Citation
 PLOS ONE, Vol.11(9) : e0163092, 2016 
Journal Title
 PLOS ONE 
Issue Date
2016
Abstract
BACKGROUND: Photographs of skin wounds have the most important information during the secondary intention healing (SIH). However, there is no standard method for handling those images and analyzing them efficiently and conveniently. OBJECTIVE: To investigate the sequential changes of SIH depending on the body sites using a color patch method. METHODS: We performed retrospective reviews of 30 patients (11 facial and 19 non-facial areas) who underwent SIH for the restoration of skin defects and captured sequential photographs with a color patch which is specially designed for automatically calculating defect and scar sizes. RESULTS: Using a novel image analysis method with a color patch, skin defects were calculated more accurately (range of error rate: -3.39% ~ + 3.05%). All patients had smaller scar size than the original defect size after SIH treatment (rates of decrease: 18.8% ~ 86.1%), and facial area showed significantly higher decrease rate compared with the non-facial area such as scalp and extremities (67.05 ± 12.48 vs. 53.29 ± 18.11, P < 0.05). From the result of estimating the date corresponding to the half of the final decrement, all of the facial area showed improvements within two weeks (8.45 ± 3.91), and non-facial area needed 14.33 ± 9.78 days. CONCLUSION: From the results of sequential changes of skin defects, SIH can be recommended as an alternative treatment method for restoration with more careful dressing for initial two weeks.
Files in This Item:
T201605596.pdf Download
DOI
10.1371/journal.pone.0163092
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Dermatology (피부과학교실) > 1. Journal Papers
Yonsei Authors
Chung, Kee Yang(정기양) ORCID logo https://orcid.org/0000-0003-3257-0297
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/152890
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