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조현병 환자에서 자기상에 대한 양가감정의 특성

Other Titles
 Characteristics of Ambivalence of Self-image in Patients with Schizophrenia 
Authors
 김병훈  ;  신유빈  ;  경성현  ;  이선구  ;  김은주  ;  김재진 
Citation
 Korean Journal of Schizophrenia Research (대한조현병학회지), Vol.19(1) : 5-9, 2016 
Journal Title
 Korean Journal of Schizophrenia Research (대한조현병학회지) 
ISSN
 2287-6995 
Issue Date
2016
Keywords
Schizophrenia ; Ambivalence ; Self-image
Abstract
Objectives: Ambivalence of self-image is considered to be important in patients with schizophrenia since impairment of self-referential processing and increment in ambivalence are illness-related symptoms. This study aimed to evaluate quantitative and qualitative properties of ambivalence of self-image in patients with schizophrenia. Methods: Twenty patients with schizophrenia and 20 normal controls performed a set of ’self-image reflection task’ and then the level of ambivalence towards actual and ideal self-image were numerically scored. Ambivalence scores were compared between groups and correlation analyses with psychometric scales were done in each group. Results: Patients with schizophrenia had higher level of ambivalence towards both actual and ideal self-image (p<0.001). Normal controls showed significant correlations with the scales representing level of self-concept clarity (r=-0.480, p=0.033), depression (r=0.479, p=0.033), and self-esteem (r=-0.555, p=0.011 ; R=-0.600, p=0.005) while the patients did not. Conclusion: Ambivalence towards one’s self-image is more intense in patients with schizophrenia. This symptom may be considered to exist as an independent symptom in schizophrenia.
Files in This Item:
T201602953.pdf Download
DOI
10.16946/kjsr.2016.19.1.5
Appears in Collections:
1. College of Medicine (의과대학) > BioMedical Science Institute (의생명과학부) > 1. Journal Papers
1. College of Medicine (의과대학) > Dept. of Psychiatry (정신과학교실) > 1. Journal Papers
Yonsei Authors
Kyeong, Sung Hyon(경성현)
Kim, Byung Hoon(김병훈)
Kim, Jae Jin(김재진) ORCID logo https://orcid.org/0000-0002-1395-4562
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/151830
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