YUHSpace: 뇌파검사에 수반하는 기술적 문제 및 안전성

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뇌파검사에 수반하는 기술적 문제 및 안전성

Other Titles: Technical Pitfall and Electrical Safety of EEG Procedure

Authors: 조양제

Citation: Journal of the Korean Society for Clinical Neurophysiology (대한임상신경생리학회지), Vol.11(Suppl.) : 88-95, 2009-11

Journal Title: Journal of the Korean Society for Clinical Neurophysiology(대한임상신경생리학회지)

ISSN: 1229-6414

Issue Date: 2009-11

Keywords: Electroencephalography ; Technical Pitfall ; Safety ; Artifact ; Variants

Appears in Collections:: 1. College of Medicine (의과대학) > Dept. of Neurology (신경과학교실) > 1. Journal Papers

Yonsei Authors: Cho, Yang Je(조양제)

URI: https://ir.ymlib.yonsei.ac.kr/handle/22282913/178646

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