뇌파검사에 수반하는 기술적 문제 및 안전성

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DC Field	Value	Language
dc.contributor.author	조양제	-
dc.date.accessioned	2020-08-14T03:14:57Z	-
dc.date.available	2020-08-14T03:14:57Z	-
dc.date.issued	2009-11	-
dc.identifier.issn	1229-6414	-
dc.identifier.uri	https://ir.ymlib.yonsei.ac.kr/handle/22282913/178646	-
dc.description.statementOfResponsibility	prohibition	-
dc.language	Korean	-
dc.publisher	대한임상신경생리학회	-
dc.relation.isPartOf	Journal of the Korean Society for Clinical Neurophysiology (대한임상신경생리학회지)	-
dc.rights	CC BY-NC-ND 2.0 KR	-
dc.title	뇌파검사에 수반하는 기술적 문제 및 안전성	-
dc.title.alternative	Technical Pitfall and Electrical Safety of EEG Procedure	-
dc.type	Article	-
dc.contributor.college	College of Medicine (의과대학)	-
dc.contributor.department	Dept. of Neurology (신경과학교실)	-
dc.contributor.googleauthor	조양제	-
dc.contributor.localId	A03851	-
dc.relation.journalcode	J01851	-
dc.identifier.eissn	2288-1026	-
dc.subject.keyword	Electroencephalography	-
dc.subject.keyword	Technical Pitfall	-
dc.subject.keyword	Safety	-
dc.subject.keyword	Artifact	-
dc.subject.keyword	Variants	-
dc.contributor.alternativeName	Cho, Yang Je	-
dc.contributor.affiliatedAuthor	조양제	-
dc.citation.volume	11	-
dc.citation.number	Suppl.	-
dc.citation.startPage	88	-
dc.citation.endPage	95	-
dc.identifier.bibliographicCitation	Journal of the Korean Society for Clinical Neurophysiology (대한임상신경생리학회지), Vol.11(Suppl.) : 88-95, 2009-11	-

Appears in Collections:: 1. College of Medicine (의과대학) > Dept. of Neurology (신경과학교실) > 1. Journal Papers

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