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뇌파검사에 수반하는 기술적 문제 및 안전성

DC FieldValueLanguage
dc.contributor.author조양제-
dc.date.accessioned2020-08-14T03:14:57Z-
dc.date.available2020-08-14T03:14:57Z-
dc.date.issued2009-11-
dc.identifier.issn1229-6414-
dc.identifier.urihttps://ir.ymlib.yonsei.ac.kr/handle/22282913/178646-
dc.description.statementOfResponsibilityprohibition-
dc.languageKorean-
dc.publisher대한임상신경생리학회-
dc.relation.isPartOfJournal of the Korean Society for Clinical Neurophysiology (대한임상신경생리학회지)-
dc.rightsCC BY-NC-ND 2.0 KR-
dc.title뇌파검사에 수반하는 기술적 문제 및 안전성-
dc.title.alternativeTechnical Pitfall and Electrical Safety of EEG Procedure-
dc.typeArticle-
dc.contributor.collegeCollege of Medicine (의과대학)-
dc.contributor.departmentDept. of Neurology (신경과학교실)-
dc.contributor.googleauthor조양제-
dc.contributor.localIdA03851-
dc.relation.journalcodeJ01851-
dc.identifier.eissn2288-1026-
dc.subject.keywordElectroencephalography-
dc.subject.keywordTechnical Pitfall-
dc.subject.keywordSafety-
dc.subject.keywordArtifact-
dc.subject.keywordVariants-
dc.contributor.alternativeNameCho, Yang Je-
dc.contributor.affiliatedAuthor조양제-
dc.citation.volume11-
dc.citation.numberSuppl.-
dc.citation.startPage88-
dc.citation.endPage95-
dc.identifier.bibliographicCitationJournal of the Korean Society for Clinical Neurophysiology (대한임상신경생리학회지), Vol.11(Suppl.) : 88-95, 2009-11-
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Neurology (신경과학교실) > 1. Journal Papers

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