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Accuracy of modified CAD/CAM generated wafer for orthognathic surgery

Authors
 Jin Hoo Park  ;  Yong-Bin Lee  ;  Sang Yoon Kim  ;  Hyung Jun Kim  ;  Young-Soo Jung  ;  Hwi-Dong Jung 
Citation
 PLoS One, Vol.14(5) : e0216945, 2019 
Journal Title
 PLoS One 
Issue Date
2019
Abstract
The aim of this study was to investigate an accuracy of modified CAD/CAM generated wafers for orthognathic surgery. A total of 20 patients who had undergone bimaxillary orthognathic surgery were included and divided into two groups: A conventional CAD/CAM generated intermediate wafer and a modified CAD/CAM generated intermediate wafer. A series of CT images were taken to compare the virtual simulations with the actual postoperative outcomes(1 month after surgery). In conventional group, the mean difference of maxillary position between virtual simulation models and postoperative results was 0.78mm and overall average error within 1mm was observed in 66.4% of the repositioned maxilla. In modified group, the mean difference was 0.77mm and overall average error within 1mm was observed in 68.3%. There were no significant statistic differences between two groups in maxillary position. This study suggests that the CAD/CAM generated wafer provides excellent accuracy. The modified CAD/CAM wafer was only comparable to conventional design in accuracy and it cannot guarantee the superior precision. However, the modified design could be beneficial in cases with unstable condylar position or for inexperienced surgeons.
Files in This Item:
T201901867.pdf Download
DOI
10.1371/journal.pone.0216945
Appears in Collections:
2. College of Dentistry (치과대학) > Dept. of Oral and Maxillofacial Surgery (구강악안면외과학교실) > 1. Journal Papers
Yonsei Authors
Kim, Hyung Jun(김형준) ORCID logo https://orcid.org/0000-0001-8247-4004
Park, Jin Hoo(박진후) ORCID logo https://orcid.org/0000-0003-2337-9554
Lee, Yong Bin(이용빈)
Jung, Young Soo(정영수) ORCID logo https://orcid.org/0000-0001-5831-6508
Jung, Hwi Dong(정휘동) ORCID logo https://orcid.org/0000-0003-1025-8323
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/170208
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