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Mode of delivery influences the regression of abnormal cervical cytology

Authors
 Chung S.M.  ;  Son G.H.  ;  Nam E.J.  ;  Kim Y.H.  ;  Kim Y.T.  ;  Park Y.W.  ;  Kwon J.Y. 
Citation
 Gynecologic and Obstetric Investigation, Vol.72(4) : 234-238, 2011 
Journal Title
 Gynecologic and Obstetric Investigation 
ISSN
 0378-7346 
Issue Date
2011
Abstract
AIMS: The purpose was to investigate the influence of delivery mode on the postpartum regression of abnormal cervical cytology. METHODS: A retrospective review was conducted of 64 pregnant women with abnormal cervical cytology at Yonsei University Health System in Korea between 2001 and 2008. A Papanicolaou smear and pathological data were categorized into three groups by cervical intraepithelial neoplasia classification. Postpartum evaluation was taken 3-6 months after delivery. The regression rates of cervical cytologic findings were compared between the vaginal delivery group and Cesarean section group. p < 0.05 was considered significant. RESULTS: Of the 64 women, 45 (70.3%) were delivered vaginally and 19 (29.7%) by cesarean section. No significant difference was found between the two groups with respect to age, gestational age, parity, smoking, and HPV (human papilloma virus) screening. Postpartum regression was shown in 39 (92.9%) women who delivered vaginally and in 12 (63.2%) women who underwent cesarean section (p = 0.016). In the cesarean section group, 1 patient had progressed from CIN2 to microinvasive cancer and 2 patients from carcinoma in situ to invasive cancer. CONCLUSION: The rate of spontaneous regression of antepartum abnormal cervical cytology was higher after vaginal delivery
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/95320
DOI
10.1159/000324500
Appears in Collections:
1. Journal Papers (연구논문) > 1. College of Medicine (의과대학) > Dept. of Obstetrics and Gynecology (산부인과학교실)
Yonsei Authors
권자영(Kwon, Ja Young) ; 김영태(Kim, Young Tae) ; 김영한(Kim, Young Han) ; 남은지(Nam, Eun Ji) ; 박용원(Park, Yong Won) ; 손가현(Son, Ga Hyun) ; 정수민(Chung, Sue Min)
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http://www.karger.com/Article/FullText/324500
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