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X-선 Verification 필름의 반응 특성에 관한 연구

DC FieldValueLanguage
dc.contributor.author성진실-
dc.date.accessioned2020-07-02T17:56:50Z-
dc.date.available2020-07-02T17:56:50Z-
dc.date.issued1998-
dc.identifier.issn1229-8719-
dc.identifier.urihttps://ir.ymlib.yonsei.ac.kr/handle/22282913/177127-
dc.description.abstractof the commercially available CEA TVS film in comparison with the Kodak X-Omat V film. Materials and Methods : For this purpose, we have formulated an analytic expression of the characteristic curves for x-ray film exposed to mixed radiation of electrons, photons, and visible light. This mathematical expression was developed based on reaction-rate and target-hit theories. Unlike previous expressions. it relates optical density to emulsion properties such as grain size and silver bromide content We have also developed a quantity which characterizes the film response to visible light relative to that to photons and electrons. This quantity could be expressed as a function of grain area. Thus, we have developed mathematical expressions and quantities with which the emulsion properties of the films can be revealed based on the sensitometric characteristics. Demonstrating the use of this analytical study, we exposed CEA and Kodak verification films to the mixed radiation of electrons, photons, and visible light, and interpreted the experimental results accordingly. Results : We have demonstrated that: (1) the saturation density increases as the silver bromide content increases, (2) the time required to reach the threshold dose (to which the film begins to respond) when films are exposed to visible light decreases as the grain size increases, and (3) the CEA film contains more silver bromide. whereas the Kodak film contains larger grains. These findings were supported by the data provided by the manufacturers afterward. Conclusion : This study presented an analytical and experimental basis for understanding the response of X-ray film with respect to the emulsion properties.-
dc.description.statementOfResponsibilityopen-
dc.languageKorean-
dc.publisher대한방사선종양학회-
dc.relation.isPartOfJournal of the Korean Society for Therapeutic Radiology and Oncology-
dc.rightsCC BY-NC-ND 2.0 KR-
dc.titleX-선 Verification 필름의 반응 특성에 관한 연구-
dc.title.alternativeUnderstanding the response characteristics of X-ray verification film-
dc.typeArticle-
dc.contributor.collegeCollege of Medicine (의과대학)-
dc.contributor.departmentDept. of Radiation Oncology (방사선종양학교실)-
dc.contributor.googleauthor여인환-
dc.contributor.googleauthor성진실-
dc.contributor.googleauthor추성실-
dc.contributor.googleauthor김귀언-
dc.contributor.googleauthor서창옥-
dc.contributor.localIdA01956-
dc.relation.journalcodeJ01857-
dc.contributor.alternativeNameSeong, Jin Sil-
dc.contributor.affiliatedAuthor성진실-
dc.citation.volume16-
dc.citation.number4-
dc.citation.startPage505-
dc.citation.endPage515-
dc.identifier.bibliographicCitationJournal of the Korean Society for Therapeutic Radiology and Oncology, Vol.16(4) : 505-515, 1998-
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Radiation Oncology (방사선종양학교실) > 1. Journal Papers

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