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Label-free quantification of cell-to-substrate separation by surface plasmon resonance microscopy

Authors
 Taehwang Son  ;  Jinwon Seo  ;  In-Hong Choi  ;  Donghyun Kim 
Citation
 Optics Communications, Vol.422 : 64-68, 2018 
Journal Title
 Optics Communications 
Issue Date
2018
Keywords
Surface plasmon resonance microscopy ; Cell-to-substrate separation distance ; Label-free imaging ; Cell adhesion ; Axial localization
Abstract
We study surface plasmon resonance microscopy (SPRM) for label-free quantification of cell-to-substrate separation. We have established a depth extraction model in which we compare a layered cell substrate model with resonance characteristics obtained by SPRM. We have applied the model to human aortic endothelial cell (HAEC) culture and determined the separation distance to be 40–60 nm. We have also investigated the precision of the SPRM model associated with the deviation in the model parameters, which is estimated to be 15 nm. The results can serve as the basis for more extensive cell-to-surface studies in a massive and automated way.
Full Text
https://www.sciencedirect.com/science/article/pii/S0030401817308878
DOI
10.1016/j.optcom.2017.10.001
Appears in Collections:
1. Journal Papers (연구논문) > 1. College of Medicine (의과대학) > Dept. of Microbiology (미생물학교실)
Yonsei Authors
최인홍(Choi, In Hong) ORCID logo https://orcid.org/0000-0001-9851-0137
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URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/163195
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