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Serological predictors for the recurrence of atrial fibrillation after electrical cardioversion

 Sook Kyoung Kim  ;  Hui-Nam Pak  ;  Jae Hyung Park  ;  Kyoung Jeong Ko  ;  Jihei Sara Lee  ;  Jin Wi  ;  Jong Il Choi  ;  Young-Hoon Kim 
 KOREAN CIRCULATION JOURNAL, Vol.40(4) : 185-190, 2010 
Journal Title
Issue Date
Atrial fibrillation ; Electric countershock ; Recurrence
BACKGROUND AND OBJECTIVES: Although electrical cardioversion (CV) is effective in restoring sinus rhythm (SR) in patients with atrial fibrillation (AF), AF frequently recurs in spite of antiarrhythmic medications. We investigated the predictors of failed CV and AF recurrence after successful CV. SUBJECTS AND METHODS: In 81 patients (M:F=63:18, 59.1+/-10.5 years old) with AF who underwent CV, clinical findings and pre-CV serologic markers were evaluated. RESULTS: During 13.1+/-10.6 months of follow-up, 8.6% (7/81) showed failed CV, 27.16% (22/81) showed early recurrence atrial fibrillation (ERAF; </=2 weeks), 32.1% (26/81) had late recurrence atrial fibrillation (LRAF; >2 weeks), and 32.1% (26/81) remained in SR and had no recurrence (NR). Plasma levels of transforming growth factor beta (TGF)-beta were significantly higher in patients with failed CV than in those with successful CV (p=0.0260). Patients in whom AF recurred were older (60.4+/-9.0 years old vs. 55.3+/-12.5 years old, p=0.0220), and had lower plasma levels of stromal cell derived factor (SDF)-1alpha (p=0.0105). However, there were no significant differences in these parameters between ERAF patients and LRAF patients. CONCLUSION: Post-CV recurrence commonly occurs in patients aged >60 years and who have low plasma levels of SDF-1alpha. High plasma levels of TGF-beta predict failure of electrical CV
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10.4070 / kcj.2010.40.4.185
Appears in Collections:
1. College of Medicine (의과대학) > Yonsei Biomedical Research Center (연세의생명연구원) > 1. Journal Papers
1. College of Medicine (의과대학) > Dept. of Internal Medicine (내과학교실) > 1. Journal Papers
Yonsei Authors
Kim, Sook Kyoung(김숙경)
Pak, Hui Nam(박희남) ORCID logo https://orcid.org/0000-0002-3256-3620
Wi, Jin(위진) ORCID logo https://orcid.org/0000-0003-0655-5130
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