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Predicting the severity of postoperative scars using artificial intelligence based on images and clinical data

Authors
 Jemin Kim  ;  Inrok Oh  ;  Yun Na Lee  ;  Joo Hee Lee  ;  Young In Lee  ;  Jihee Kim  ;  Ju Hee Lee 
Citation
 SCIENTIFIC REPORTS, Vol.13(1) : 13448, 2023-08 
Journal Title
SCIENTIFIC REPORTS
Issue Date
2023-08
MeSH
Algorithms ; Artificial Intelligence* ; Cicatrix* / diagnostic imaging ; Cognition ; Humans ; Neural Networks, Computer
Abstract
Evaluation of scar severity is crucial for determining proper treatment modalities; however, there is no gold standard for assessing scars. This study aimed to develop and evaluate an artificial intelligence model using images and clinical data to predict the severity of postoperative scars. Deep neural network models were trained and validated using images and clinical data from 1283 patients (main dataset: 1043; external dataset: 240) with post-thyroidectomy scars. Additionally, the performance of the model was tested against 16 dermatologists. In the internal test set, the area under the receiver operating characteristic curve (ROC-AUC) of the image-based model was 0.931 (95% confidence interval 0.910‒0.949), which increased to 0.938 (0.916‒0.955) when combined with clinical data. In the external test set, the ROC-AUC of the image-based and combined prediction models were 0.896 (0.874‒0.916) and 0.912 (0.892‒0.932), respectively. In addition, the performance of the tested algorithm with images from the internal test set was comparable with that of 16 dermatologists. This study revealed that a deep neural network model derived from image and clinical data could predict the severity of postoperative scars. The proposed model may be utilized in clinical practice for scar management, especially for determining severity and treatment initiation.

© 2023. Springer Nature Limited.
Files in This Item:
T202305146.pdf Download
DOI
10.1038/s41598-023-40395-z
Appears in Collections:
1. College of Medicine (의과대학) > Dept. of Dermatology (피부과학교실) > 1. Journal Papers
Yonsei Authors
Kim, Jemin(김제민) ORCID logo https://orcid.org/0000-0001-6628-3507
Kim, Jihee(김지희) ORCID logo https://orcid.org/0000-0002-0047-5941
Lee, Young In(이영인) ORCID logo https://orcid.org/0000-0001-6831-7379
Lee, Ju Hee(이주희) ORCID logo https://orcid.org/0000-0002-1739-5956
URI
https://ir.ymlib.yonsei.ac.kr/handle/22282913/196327
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